embedded world North America

ew25 TeaserImage 1920x500.jpg

Meet our experts in debugging, tracing, and testing at the very first embedded world Exhibition & Conference in North America

  • November 4-6, 2025
  • Anaheim Convention Center, Anaheim, California
  • Booth 2024 (Floor plan)

Experience our solutions for easy, intuitive, and reliable debugging and run-time analysis of embedded software.

We are looking forward to discuss your needs and challenges related to safety and security in automotive and industrial embedded applications.

Highlights at the Show

Leading edge multicore debugging, trace-based run-time analysis and test with UDE® for the latest automotive microcontrollers and processors:

  • Infineon AURIX
  • NXP S32 Automotive Platform

Powerful debug and analysis capabilities that enable you to develop safe and high-performance embedded software.

  • UDE SimplyTrace®
  • Advanced trace data analysis and visualization
  • Trace-based profiling
  • Non-intrusive Code Coverage
  • AUTOSAR ARTI support
  • Debug and test automation
  • and more...